Alona Kostenko

Responsible for controlling technology changes introduction, monitoring in line defect performance and end of line die yields, finding root cause for in line defect excursion and navigating fix.

Job duty is relied on manufacturing process knowledge and data analysis skill to drive factory Yield towards .

Job scope includes goal settings of Factory Yield, indicator monitor, interact and integrate multiple stakeholders into continuous Yield improvement towards Factory goals.

During new product integration, actively works with Technology Development group to learn about new product, new process and early involve in product development/envelopment to achieve healthy Yield at early product life.

Leading investigation of numerous integrated issues, manage different initiation and improvement project to accelerate Factory Quality/Yield improvement.

• SIMS Engineer - 7 years of experience on Cameca ims 7f, in semiconductors industry , responsible for the maintenance of the instrument, Supporting customer SIMS requests analyze thin films, deep implants, shallow implants and other kinds of layers,
• the role including: Set up the tool, data processing and reports preparations, advanced level of
• tool operation, new method of work(Mass spectrum in parallel to depth profile) these method help
• us to investigate special cases. Support different areas for advanced tests or in case of
• excursions,Semiconductors industrial, Yield dep. Intel Corporation.
• Have an experience in SEM/EDS technics top/cross section imaging data analysis
• in case of EDS, summarized presentation preparation (data and conclusions present)
• Introduction in process engineering in Implantation area completed ( Implanter tools
• knowledge). Intel Corporation.
• Ergonomics - Leading team to work with less ergo injuries as possible, with deep understanding of possible risks,
• Project manager - Leading innovative project which has impact on Intel Clean Room environment, Project has been started from the idea until full implementation,
• experience included;DOE, statistical modules, Gannt, charts, budget plan, calculation of ROI, close work with many external suppliers in IS and USA.

Project in the micro-optical company "Nanonics Imaging .Ltd" (The project based on monolayer depositing, to create two dimensional arrays of nano- particles). The Integral part of the work includes: DOE to define best method,samples preparation in clean room environment for microscopic analysis by next Technics: AFM/ SEM and NSOM